Element GD Plus
Defining Quality Standards for the Analysis of Solid Samples
Providing complete material characterization mainly for metallurgy, the Thermo Scientific™ ELEMENT™ GD PLUS Glow Discharge Mass Spectrometer (GD-MS) features a fast glow discharge ion source in a high-resolution double-focusing mass spectrometer. The ideal tool for the direct analysis of high purity conductive and semi-conductive materials. Almost all elements present in a solid sample can be detected and routinely quantified at or below the ppb range. Signal-to-noise ratios enabling sub-ppb detection limits based on high ion transmission combined with low background. The maximum level of selectivity and accuracy from high mass resolution of the Element GC Plus is a prerequisite for undisputable analytical results.
The Element GD Plus is equipped with µs-pulsed fast flow glow discharge cell and high sensitivity ion source with pulsed discharge mode. It offers widely adjustable sputter rates for fast bulk analyses and advanced depth profiling applications. Alumina powder analysis is done by using a secondary electrode.
The Element GD Plus is recommended for aerospace applications (e.g. nickel super alloys, composite materials, depth profiling of coatings and diffusion layers), microelectronics (e.g. copper, alumina powder, sputter targets), renewable energy research (e.g. silicon blocks, wafers, solar cells) and medical/pharmaceutical and food applications (e.g. stainless steel, alloys).
Twelve Orders of Magnitude Automatic Detection System
- Determination of ultra-traces and matrix elements within a single analysis, as fully automatic detector covers 12 orders linear dynamic range
- Direct determination of the matrix elements for IBR (Ion Beam Ratio) quantification
- Software Suite for Productivity and Ease-of-use
- Full computer control of all parameters
- Fully automated tuning, analysis and data evaluation
- Automatic LIMS connectivity
- Remote control and diagnostic
- Typically less than 10 minutes sample turn-around
- Matrix to ultra-trace detection capabilities in a single analysis
- Depth profiling from hundreds of micrometers down to single nanometers layer thickness Minimum matrix effects for straightforward quantification